ENVIRONMENTAL SOLUTIONS FOR ADVANCED FAILURE ANALYSIS (FA) LABS
Your partner in designing environments that eliminate disturbances
Advanced metrological tools such as Transmission Electron Microscopes (TEM), Scanning Electron Microscopes (SEM) and Focused Ion Beam (FIB) systems, commonly used in the semiconductor and research industries, are so sensitive that even the smallest environmental disturbances may compromise image data accuracy.
MyCAE Technologies and RF Station specialise in delivering turnkey engineering solutions for the design, construction and commissioning of the most demanding Failure Analysis (FA) laboratories.
Our Expertise
Precision Lab Design, Build, Commissioning and Compliance Testing based on Multidisciplinary Domain Expertise encompassing the following:
Why Choose Us
We are a trusted partner for delivering engineering solutions that meet the most stringent metrological and inspection tool requirements.

Deep technical insight from years of vibration, acoustic and electromagnetic engineering within semiconductor plants.

Independent solution integrator for optimal cost and delivery timeline.

Turnkey execution from design to handover, focusing on the details of integrations and interfaces.
OUR COMMITMENT TO EXCELLENCE
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